Atmel CAMELIA 8M Bedienungsanleitung PDF herunterladen (Seite 18)

CAMELIA 8M Digital Camera

1986B–IMAGE–03/03

Image Grade

Specification

• Defect Sizes

– Blemish: 1 x 1 defect.

– Cluster: blemish grouping of not more than a given number of adjacent

defects:

1 x 1 < cluster 1 size ≤ 2 x 2

2 x 2 < cluster 2 size ≤ 5 x 5

– Column: one-pixel-wide column with more than 7 contiguous defective

pixels.

– Defect separation: defects are separated by no less than "D min" pixels in

any direction.

• Defects in Darkness

– Blemish or cluster: pixel(s) whose signal deviate(s) more than 150 LSB.

– Column: column whose signal deviates more than 15 LSB.

• Defects under Illumination

– Blemish or cluster: pixel(s) which deviate(s) by more than +20% or -30%

from the "average" pixel.

– Column: column which deviates by more than 10% from the "average"

column.

Defect Test Conditions • Room temperature = 20°C.

• Integration time in darkness = 100 ms.

• Light source: Halogen 3200K with BG38 (2 mm thick) IR cut- off with f/11 aperture.

• Test under illumination at 50% of saturation level.

• No software correction performed.

• Deviations specified with CDS gain = 1.

Classifications

Table 11. Image Grade Classifications

Grade

Blemishes Cluster 1 Cluster 2 Column

Total D min Total D min Total D min Total D min

E ≤ 500 3 ≤ 30 50 ≤ 6100≤ 5150

H ≤ 300 3 ≤ 10500–0–

1 2 ... 13 14 15 16 17 18 19 20 21

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